Drain-current variability in 45 nm bulk N-MOSFET with and without pocket-implants
| Autor: | Mezzomo, Cecilia M., Bajolet, Aurélie, Cathignol, Augustin, Ghibaudo, Gérard |
|---|---|
| Zdroj: | In Solid State Electronics November-December 2011 65-66:163-169 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect