Gate-edge charges related effects and performance degradation in advanced multiple-gate MOSFETs
| Autor: | Kilchytska, V., Alvarado, J., Collaert, N., Rooyackers, R., Put, S., Simoen, E., Claeys, C., Flandre, D. |
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| Zdroj: | In Solid State Electronics 2011 59(1):18-24 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect