Modeling local electrical fluctuations in 45 nm heavily pocket-implanted bulk MOSFET
| Autor: | Mezzomo, Cecilia M., Bajolet, Aurelie, Cathignol, Augustin, Josse, Emmanuel, Ghibaudo, Gérard |
|---|---|
| Zdroj: | In Solid State Electronics 2010 54(11):1359-1366 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect