Development of Time-resolved UV Micro-Raman Spectroscopy to measure temperature in AlGaN/GaN HEMTs
| Autor: | Lancry, O., Pichonat, E., Réhault, J., Moreau, M., Aubry, R., Gaquière, C. |
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| Zdroj: | In Solid State Electronics 2010 54(11):1434-1437 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect