Investigation of the performance of strained-SiGe vertical IMOS-transistors
| Autor: | Dinh, Thanh Viet, Kraus, Rainer, Jungemann, Christoph |
|---|---|
| Zdroj: | In Solid State Electronics 2010 54(9):942-949 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
| Autor: | Dinh, Thanh Viet, Kraus, Rainer, Jungemann, Christoph |
|---|---|
| Zdroj: | In Solid State Electronics 2010 54(9):942-949 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect