Impact of the gate stack on the electrical performances of 3D multi-channel MOSFET (MCFET) on SOI
Autor: | Bernard, Emilie, Ernst, T., Guillaumot, B., Vulliet, N., Garros, X., Maffini-Alvaro, V., Coronel, P., Skotnicki, T., Deleonibus, S. |
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Zdroj: | In Solid State Electronics September 2008 52(9):1297-1302 |
Databáze: | ScienceDirect |
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