Physics-based 1/ f noise model for MOSFETs with nitrided high- κ gate dielectrics

Autor: Morshed, Tanvir Hasan, Devireddy, Siva Prasad, Çelik-Butler, Zeynep, Shanware, Ajit, Green, Keith, Chambers, J.J., Visokay, M.R., Colombo, Luigi
Zdroj: In Solid State Electronics 2008 52(5):711-724
Databáze: ScienceDirect