An EKV-based high voltage MOSFET model with improved mobility and drift model

Autor: Chauhan, Yogesh Singh, Gillon, Renaud, Bakeroot, Benoit, Krummenacher, Francois, Declercq, Michel, Ionescu, Adrian Mihai
Zdroj: In Solid State Electronics 2007 51(11):1581-1588
Databáze: ScienceDirect