Temperature effect of metal–oxide–semiconductor field-effect-transistors’ gate current evaluated with the mask dimensions
| Autor: | Yeh, Chun-Chia, Neih, Chun-Feng, Chen, Yen-Yu, Gong, Jeng |
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| Zdroj: | In Solid State Electronics February 2008 52(2):215-220 |
| Databáze: | ScienceDirect |
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