Some issues of hot-carrier degradation and negative bias temperature instability of advanced SOI CMOS transistors
| Autor: | Ioannou, D.P., Ioannou, D.E. |
|---|---|
| Zdroj: | In Solid State Electronics 2007 51(2):268-277 |
| Databáze: | ScienceDirect |
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| Autor: | Ioannou, D.P., Ioannou, D.E. |
|---|---|
| Zdroj: | In Solid State Electronics 2007 51(2):268-277 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect