Impact of device scaling on the 1/f noise performance of deep submicrometer thin gate oxide CMOS devices
| Autor: | Chew, Kok Wai, Yeo, Kiat Seng, Chu, Shao-Fu Sanford, Cheng, Michael |
|---|---|
| Zdroj: | In Solid State Electronics July-August 2006 50(7-8):1219-1226 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect