Study of leakage-induced photon emission processes in sub-90 nm CMOS devices
| Autor: | Weizman, Y., Gurfinkel, M., Margulis, A., Fefer, Y., Shapira, Y., Baruch, E. |
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| Zdroj: | In Solid State Electronics 2006 50(6):920-923 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect