Numerical modeling of RF noise in scaled MOS devices
| Autor: | Jungemann, C., Neinhüs, B., Nguyen, C.D., Scholten, A.J., Tiemeijer, L.F., Meinerzhagen, B. |
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| Zdroj: | In Solid State Electronics 2006 50(1):10-17 |
| Databáze: | ScienceDirect |
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| Autor: | Jungemann, C., Neinhüs, B., Nguyen, C.D., Scholten, A.J., Tiemeijer, L.F., Meinerzhagen, B. |
|---|---|
| Zdroj: | In Solid State Electronics 2006 50(1):10-17 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect