Combined master and Fokker–Planck equations for the modeling of the kinetics of extended defects in Si

Autor: Lampin, E., Ortiz, C.J., Cowern, N.E.B., Colombeau, B., Cristiano, F.
Zdroj: In Solid State Electronics 2005 49(7):1168-1171
Databáze: ScienceDirect