Combined master and Fokker–Planck equations for the modeling of the kinetics of extended defects in Si
Autor: | Lampin, E., Ortiz, C.J., Cowern, N.E.B., Colombeau, B., Cristiano, F. |
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Zdroj: | In Solid State Electronics 2005 49(7):1168-1171 |
Databáze: | ScienceDirect |
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