Electrothermal simulations of high-power SOI vertical DMOS transistors with lateral drain contacts under unclamped inductive switching test
| Autor: | Pinardi, Kuntjoro, Heinle, Ulrich, Bengtsson, Stefan, Olsson, Jörgen, Colinge, Jean-Pierre |
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| Zdroj: | In Solid State Electronics 2004 48(7):1119-1126 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect