Electrical characterization of 12 nm EJ-MOSFETs on SOI substrates
| Autor: | Henschel, W., Wahlbrink, T., Georgiev, Y.M., Lemme, M., Mollenhauer, T., Vratzov, B., Fuchs, A., Kurz, H., Kittler, M., Schwierz, F. |
|---|---|
| Zdroj: | In Solid State Electronics 2004 48(5):739-745 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect