Exoelectron emission studies of trap spectrum in ultrathin amorphous Si 3N 4 films
| Autor: | Naich, M., Rosenman, G., Roizin, Ya., Molotskii, M. |
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| Zdroj: | In Solid State Electronics 2004 48(3):477-482 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Naich, M., Rosenman, G., Roizin, Ya., Molotskii, M. |
|---|---|
| Zdroj: | In Solid State Electronics 2004 48(3):477-482 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect