Effects of a molecular beam epitaxy grown AlN passivation layer on AlGaN/GaN heterojunction field effect transistors

Autor: Hwang, Jeonghyun, Schaff, William J., Green, Bruce M., Cha, Hoyoung, Eastman, Lester F.
Zdroj: In Solid State Electronics 2004 48(2):363-366
Databáze: ScienceDirect