Defect spectroscopy using 1/ fγ noise of gate leakage current in ultrathin oxide MOSFETs
| Autor: | Lee, Jonghwan, Bosman, Gijs |
|---|---|
| Zdroj: | In Solid State Electronics 2003 47(11):1973-1981 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Lee, Jonghwan, Bosman, Gijs |
|---|---|
| Zdroj: | In Solid State Electronics 2003 47(11):1973-1981 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect