Hot-carrier induced degradation and recovery in polysilicon-emitter bipolar transistors
| Autor: | Sheng, S.R, McAlister, S.P, Storey, C, Lee, L.-S, Hwang, H.P |
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| Zdroj: | In Solid State Electronics 2002 46(10):1603-1608 |
| Databáze: | ScienceDirect |
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