Study of the leakage drain current carriers in silicon-on-insulator MOSFETs at high temperatures
| Autor: | Bellodi, Marcello *, Antonio Martino, João |
|---|---|
| Zdroj: | In Solid State Electronics 2001 45(5):683-688 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Bellodi, Marcello *, Antonio Martino, João |
|---|---|
| Zdroj: | In Solid State Electronics 2001 45(5):683-688 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect