Effect of grain boundaries on hot-carrier induced degradation in large grain polysilicon thin-film transistors
| Autor: | Dimitriadis, C.A *, Kimura, M, Miyasaka, M, Inoue, S, Farmakis, F.V, Brini, J, Kamarinos, G |
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| Zdroj: | In Solid State Electronics 2000 44(11):2045-2051 |
| Databáze: | ScienceDirect |
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