Iterative critical ray tracing for local tolerance analysis of freeform imaging systems

Autor: Fan, Rundong, Wei, Shili, Qian, Zhuang, Ji, Huiru, Tan, Hao, Mo, Yan, Yang, Le, Ma, Donglin
Zdroj: In Optics Communications 15 January 2025 575
Databáze: ScienceDirect