Measurement in-plane deformations in electronic speckle pattern interferometry using phase-shifting modulated by polarization

Autor: Gómez-Méndez, Gustavo A., Martínez-García, Amalia, Serrano-García, David I., Rayas-Álvarez, Juan Antonio, Pérez, Areli Montes, Islas-Islas, Juan M., Toto-Arellano, Noel Ivan
Zdroj: In Optics Communications 1 November 2021 498
Databáze: ScienceDirect