Basic model of absorption depth and injection levels in silicon under intermediate illumination levels
Autor: | Aharoni, Ran, Sinvani, Moshe, Tischler, Yaakov R., Zalevsky, Zeev |
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Zdroj: | In Optics Communications 15 March 2013 291:1-6 |
Databáze: | ScienceDirect |
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