Thermal stress effects of the diode-end-pumped Nd:YLF slab

Autor: Ma, Zhe, Gao, Jiancun, Li, Daijun, Li, Junlin, Wu, Nianle, Du, Keming
Zdroj: In Optics Communications 2008 281(13):3522-3526
Databáze: ScienceDirect