Polarization sensitivity characterization under normal incidence of a multiple quantum wells saturable absorber nonlinear mirror as a function of the temperature of the chip
Autor: | Le Cren, Élodie, Lobo, Sébastien, Fève, Sylvain, Simon, Jean-Claude |
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Zdroj: | In Optics Communications 1 October 2005 254(1-3):96-103 |
Databáze: | ScienceDirect |
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