Polarization sensitivity characterization under normal incidence of a multiple quantum wells saturable absorber nonlinear mirror as a function of the temperature of the chip

Autor: Le Cren, Élodie, Lobo, Sébastien, Fève, Sylvain, Simon, Jean-Claude
Zdroj: In Optics Communications 1 October 2005 254(1-3):96-103
Databáze: ScienceDirect