Oriented design of wafer-level stacking structures to enhance reliability of laser debonding of thin devices

Autor: Wang, Fangcheng, Liu, Qiang, Li, Jinhui, Huang, Mingqi, Dai, Wenxue, Wang, Xuefan, Zhang, Guoping, Sun, Rong
Zdroj: In Optics and Laser Technology February 2024 169
Databáze: ScienceDirect