A spatial-phase-shift-based defect detection shearography system with independent adjustment of shear amount and spatial carrier frequency

Autor: Sun, Fangyuan, Dan, Xizuo, Yan, Peizheng, Zhao, Qihan, Zhong, Shimin, Wang, Yonghong
Zdroj: In Optics and Laser Technology April 2020 124
Databáze: ScienceDirect