Construction and operation of a simple electronic speckle pattern interferometer and its use in measuring microscopic deformations
| Autor: | Abedin, K.M. *, Jesmin, S.A., Haider, A.F.M.Y. |
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| Zdroj: | In Optics and Laser Technology 2000 32(5):323-328 |
| Databáze: | ScienceDirect |
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