Cell array structure test in EEPROM reliability assessment at an early process development stage
| Autor: | Pio, F *, Gomiero, E |
|---|---|
| Zdroj: | In Microelectronics Reliability 1 April 2000 40(4-5):719-722 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Pio, F *, Gomiero, E |
|---|---|
| Zdroj: | In Microelectronics Reliability 1 April 2000 40(4-5):719-722 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect