Trapping mechanisms in negative bias temperature stressed p-MOSFETs
| Autor: | Schlünder, Christian, Brederlow, Ralf, Wieczorek, Peter, Dahl, Claus, Holz, Jürgen, Röhner, Michael, Kessel, Sylvia, Herold, Volker, Goser, Karl, Weber, Werner, Thewes, Roland |
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| Zdroj: | In Microelectronics Reliability 1999 39(6):821-826 |
| Databáze: | ScienceDirect |
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