Effects of humidity, ionic contaminations and temperature on the degradation of silicone-based sealing materials used in microelectronics
| Autor: | Mehr, M. Yazdan, Hajipour, P., Karampoor, M.R., van Zeijl, H., van Driel, W.D., Cooremans, T., De Buyl, F., Zhang, G.Q. |
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| Zdroj: | In Microelectronics Reliability January 2025 164 |
| Databáze: | ScienceDirect |
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