Experimental analysis of NBTI effects on QDI circuits with resistive bridging faults
| Autor: | Lamine, Zina, Ait Abdelmalek, Ghania, Ziani, Rezki, Mokdad, Rabah |
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| Zdroj: | In Microelectronics Reliability December 2024 163 |
| Databáze: | ScienceDirect |
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