Radiation hardened P-Quatro 12T SRAM cell with strong SEU tolerance for aerospace applications
| Autor: | Mondal, Debabrata, Naz, Syed Farah, Shah, Ambika Prasad |
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| Zdroj: | In Microelectronics Reliability November 2024 162 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect