A machine learning approach to accelerate reliability prediction in nanowire FETs from self-heating perspective
| Autor: | Kumar, T. Sandeep a, Hazarika, Anusha a, Srinivas, P.S.T.N. b, Tiwari, Pramod Kumar c, Kumar, Arun a, ⁎ |
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| Zdroj: | In Microelectronics Reliability October 2024 161 |
| Databáze: | ScienceDirect |
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