Aggravated NBTI reliability due to hard-to-detect open defects

Autor:	Aguirre, Gustavo, Gamez, Jesus, Champac, Victor
Zdroj:	In Microelectronics Reliability September 2024 160
Databáze:	ScienceDirect
Externí odkaz:	Zobrazit plný text záznamu Full Text from ScienceDirect