Lifetime reliability modeling on EMC performance of digital ICs influenced by the environmental and aging constraints: A case study
| Autor: | Al Rashid, Jaber, Koohestani, Mohsen, Saintis, Laurent, Barreau, Mihaela |
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| Zdroj: | In Microelectronics Reliability August 2024 159 |
| Databáze: | ScienceDirect |
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