Failure analysis of heavy ion-irradiated silicon carbide junction barrier Schottky diodes
| Autor: | Cao, Shuang, Yu, Qingkui, Wang, Qianyuan, Wang, He, Sun, Yi, Lv, He, Mei, Bo, Mo, Rigen, Li, Pengwei, Zhang, Hongwei |
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| Zdroj: | In Microelectronics Reliability June 2024 157 |
| Databáze: | ScienceDirect |
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