Research progress on the stability of transparent conductive films for silver nanowires
Autor: | You, Wanqing, Liao, Bokai, Wan, Shan, Guo, Xingpeng |
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Zdroj: | In Microelectronics Reliability May 2024 156 |
Databáze: | ScienceDirect |
Externí odkaz: |
Autor: | You, Wanqing, Liao, Bokai, Wan, Shan, Guo, Xingpeng |
---|---|
Zdroj: | In Microelectronics Reliability May 2024 156 |
Databáze: | ScienceDirect |
Externí odkaz: |