Comparative study on the short-circuit withstand capability between the superjunction and conventional field-stop IGBTs
| Autor: | Wang, Zhihao, Lin, Zhi, Hu, Shengdong, Zhou, Jianlin |
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| Zdroj: | In Microelectronics Reliability May 2024 156 |
| Databáze: | ScienceDirect |
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