Impact of SiC power MOSFET interface trap charges on UIS reliability under single pulse
| Autor: | Wu, Xiao-Dong, Wang, Ying, Yu, Cheng-Hao, Fei, Xin-xing, Yang, Jian-qun, Li, Xing-ji |
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| Zdroj: | In Microelectronics Reliability April 2024 155 |
| Databáze: | ScienceDirect |
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