Transient simulations and theoretical modeling of near-junction heat conduction in GaN-on-diamond HEMT
| Autor: | Shen, Yiyang, Fan, Xueliang, Tang, Daosheng |
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| Zdroj: | In Microelectronics Reliability January 2024 152 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Shen, Yiyang, Fan, Xueliang, Tang, Daosheng |
|---|---|
| Zdroj: | In Microelectronics Reliability January 2024 152 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect