Performance degradation and reliability analysis of a MEMS flow sensor with accelerated degradation testing
| Autor: | Kang, Qiaoqiao, Lin, Yuzhe, Tao, Jifang |
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| Zdroj: | In Microelectronics Reliability January 2024 152 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Kang, Qiaoqiao, Lin, Yuzhe, Tao, Jifang |
|---|---|
| Zdroj: | In Microelectronics Reliability January 2024 152 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect