Efficient protection of polar decoders against Single Event Upsets (SEUs) on user memories
Autor: | Tian, Dong a, Gao, Zhen b, ⁎, Wang, Ruize b, Liu, Qiang b, Ullah, Anees c, Reviriego, Pedro d |
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Zdroj: | In Microelectronics Reliability October 2023 149 |
Databáze: | ScienceDirect |
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