Efficient protection of polar decoders against Single Event Upsets (SEUs) on user memories

Autor: Tian, Dong a, Gao, Zhen b, ⁎, Wang, Ruize b, Liu, Qiang b, Ullah, Anees c, Reviriego, Pedro d
Zdroj: In Microelectronics Reliability October 2023 149
Databáze: ScienceDirect