High-temperature integrated SiC MOSFET bi-directional switch in power-overlay technology
| Autor: | Lee, Yonghwa, Castellazzi, Alberto |
|---|---|
| Zdroj: | In Microelectronics Reliability December 2023 151 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Lee, Yonghwa, Castellazzi, Alberto |
|---|---|
| Zdroj: | In Microelectronics Reliability December 2023 151 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect