Electrical instabilities of a-IGZO TFTs under different conditions of bias and illumination stress
| Autor: | Toledo, Pablo, Hernandez Luna, Isai S., Hernandez-Cuevas, Francisco, Hernandez-Como, Norberto |
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| Zdroj: | In Microelectronics Reliability September 2023 148 |
| Databáze: | ScienceDirect |
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