Vulcanization failure mechanism analysis of lead-frame LED package

Autor: Li, Yinle, Xu, Huanxiang, Zhao, Hao, Liu, Zilian, Tang, Yanhuang, Zhao, Zhenbo, Liu, Peijiang, Ren, Yan
Zdroj: In Microelectronics Reliability September 2023 148
Databáze: ScienceDirect