Physical insights into the reliability of sunken source connected field plate GaN HEMTs for mm-wave applications
| Autor: | Chanchal, Malik, Amit, Sehra, Khushwant, Laishram, Robert, Nair, Renju M., Mishra, Meena, Rawal, Dipendra Singh, Saxena, Manoj |
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| Zdroj: | In Microelectronics Reliability September 2023 148 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect