TLP/VFTLP investigation on eNVM 1T1R PCM in FD-SOI UTBB CMOS technology at room temperature
| Autor: | Galy, Ph., Jacquier, B., Sandrini, J., Arnaud, F. |
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| Zdroj: | In Microelectronics Reliability September 2023 148 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Galy, Ph., Jacquier, B., Sandrini, J., Arnaud, F. |
|---|---|
| Zdroj: | In Microelectronics Reliability September 2023 148 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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